Search results
Microelectronics Reliability > 2018 > 87 > C > 286-320
physica status solidi (a) > 215 > 10 > n/a - n/a
Solid-State Electronics > 2017 > 135 > C > 37-42
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2271 - 2284
Microelectronic Engineering > 2017 > 178 > C > 258-261
SID Symposium Digest of Technical Papers > 48 > 1 > 1238 - 1241
IEEE Transactions on Electron Devices > 2017 > 64 > 6 > 2478 - 2484
Microelectronics Reliability > 2017 > 73 > C > 153-157
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-4.1 - CR-4.6
2017 IEEE International Reliability Physics Symposium (IRPS) > CR-5.1 - CR-5.4
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1467 - 1473
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 1 > 253 - 258
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 8 > 2712 - 2725
Microelectronics Reliability > 2016 > 62 > C > 79-81